Station Configuration
Tune cycle time, yield, parallelism and MTBF live.
Process Parameters
Tune cycle time, yield, and parallelism per station
Wafer Inspection
INSP
Texturing
TEX
Diffusion (POCl₃)
DIFF
PECVD (SiNx)
PECVD
Screen Printing
PRINT
Firing Furnace
FIRE
Cell Test & Sort
CELL
Stringing
STR
Lamination
LAM
Framing & J-Box
FRAME
Final Test (EL/Flash)
TEST
Live Station Stats
| Station | Status | Buffer | Produced | Scrap | Rework | Util | Yield |
|---|---|---|---|---|---|---|---|
| Wafer Inspection | idle | 0/200 | 0 | 0 | 0 | 0% | 100.0% |
| Texturing | idle | 0/200 | 0 | 0 | 0 | 0% | 100.0% |
| Diffusion (POCl₃) | idle | 0/600 | 0 | 0 | 0 | 0% | 100.0% |
| PECVD (SiNx) | idle | 0/250 | 0 | 0 | 0 | 0% | 100.0% |
| Screen Printing | idle | 0/200 | 0 | 0 | 0 | 0% | 100.0% |
| Firing Furnace | idle | 0/300 | 0 | 0 | 0 | 0% | 100.0% |
| Cell Test & Sort | idle | 0/400 | 0 | 0 | 0 | 0% | 100.0% |
| Stringing | idle | 0/20 | 0 | 0 | 0 | 0% | 100.0% |
| Lamination | idle | 0/24 | 0 | 0 | 0 | 0% | 100.0% |
| Framing & J-Box | idle | 0/12 | 0 | 0 | 0 | 0% | 100.0% |
| Final Test (EL/Flash) | idle | 0/12 | 0 | 0 | 0 | 0% | 100.0% |